PhD student · Started in 2022

Angelo ROSSONI

Stress-related Local Layout effects in FinFET devices

CurriculumElectronics Engineering, Sensors and Instrumentation

AdvisorZsolt Kovacs

Research groupTo be confirmed

The goal of the research is modeling the effect that the cuts on the Polysilicon on the neighborhood gates have on the performance of the devices, identifying the type of stress caused by specific layout patterns

Other advisors: Luigi Colalongo, Tomasz Brozek

a.rossoni@studenti.unibs.it Publications

Profile

Short Bio

My name is Angelo Rossoni and I am a tech-savvy Micro Electronics Engineer with a 23-year track record designing, testing and developing testing structures for VLSI process, systems and devices. Collaborative team leader recognized for displaying perseverance while working through complex problems to satisfactory resolution. I graduated from the Universita’ degli Studi di Brescia in 2000 with a master’s degree in Electronic Engineer.